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Microelectronics Test Engineering Course offered by the University of New Mexico featuring thirteen experts in the field of Semiconductor Testing.

Microelectronics Test Engineering Course - Product list

See details  U. N. M. Lecture 1-30 DVD Complete Set (Save $500.00!) Soft Test has partnered with the University of New Mexico to offer a comprehensive lecture series that covers a wide range of topics associated with semiconductor test. Each of the 30 lectures is approximately 75 minutes long, total lecture time is approximately 37.5 hours. Price: $ 1,000.00 Add To Cart    View Cart See details  U. N. M. Lecture 1-3 DVD Number 1 1. Introduction to Test & Test Economics Chuck Hawkins - UNM 2. Economics of Test Chuck Hawkins - UNM 3. Test BasicsFunction, Fault, and Defect-Based Testing Chuck Hawkins - UNM Price: $ 149.00 Add To Cart    View Cart See details  U. N. M. Lecture 4-6 DVD Number 2 4. Introduction to Automated Test Equipment - ATE Chuck Hawkins - UNM 5. Test Types: Device Specs and DC Opens & Shorts Guy Perry - Soft Test 6. Test Types: DC Parameters Guy Perry - Soft Test Price: $ 149.00 Add To Cart    View Cart See details  U. N. M. Lecture 7-9 DVD Number 3 7. Test Types: Functional Testing Chris Nelson - Intel 8. Test Types: AC Parameters Guy Perry - Soft Test 9. Design for Testability (DFT) Chuck Hawkins - UNM Price: $ 149.00 Add To Cart    View Cart See details  U. N. M. Lecture 10-12 DVD Number 4 10. CMOS Defect-Based Testing Anne Gattiker - IBM Lecture by Chuck Hawkins 11. Memory Test Rob Aitken - Artisan 12. Test Cost Reduction with DFT Gordon Robinson - Consultant Price: $ 149.00 Add To Cart    View Cart See details  U. N. M. Lecture 13-15 DVD Number 5 13. Hardware Capabilities Burnie West - Credence 14. Wafer Testing Technology Bill Mann - Consultant 15. Test Vector & Program Development Laura Suriano - Intel Price: $ 149.00 Add To Cart    View Cart See details  U. N. M. Lecture 16-18 DVD Number 6 16 Memory Test Rob Aitken - Artisan 17 Board and System Test I Gordon Robinson - Consultant 18 Board and System Test II Gordon Robinson - Consultant Price: $ 149.00 Add To Cart    View Cart See details  U. N. M. Lecture 19-21 DVD Number 7 19. Tester ATE – Past, Present, Future Bob Huston 20. IP and SoC Test Basics Al Crouch - Inovys 21. IP and SoC Test Basics Al Crouch - Inovys Price: $ 149.00 Add To Cart    View Cart See details  U. N. M. Lecture 22-24 DVD Number 8 22. IP and SoC Test Basics Al Crouch - Inovys 23. Analog & Mixed Signal Testing I Peter Lindholm – Consultant t Soft-Test 24. Analog & Mixed Signal Testing III Greg Donohoe – UNM Price: $ 149.00 Add To Cart    View Cart See details  U. N. M. Lecture 25-27 DVD Number 9 25. Analog & Mixed Signal Testing IV Greg Donohoe – UNM 26. Leading Edge of Wafer Test Technology Bill Mann 27. Analog & Mixed Signal Testing II Peter Lindholm Price: $ 149.00 Add To Cart    View Cart See details  U. N. M. Lecture 28-30 DVD Number 10 28. Analog & Mixed Signal Testing V Peter Lindholm 29. Analog & Mixed Signal Testing VI Peter Lindholm 30. Putting TE Feet to the Business: A Practical Perspective Gene Hnatek - Qualcomm Price: $ 149.00 Add To Cart    View Cart