Microelectronics Failure Analysis

Lecture Series Now Available on DVD

Presented by: Soft Test Inc.
&
The University of New Mexico

- Course Overview -

Soft Test has partnered with the University of New Mexico to offer a comprehensive lecture series that covers a wide range of topics associated with semiconductor test and Failure Analysis. The University of New Mexico invited eighteen experts to give a total of 30 lectures associated with Failure Analysis and Semiconductors. The goal was to fill a gap in instruction at the university level and expose students to the thoughts from leading practitioners in the field. These lectures provide a wealth of practical information and insight into current Semiconductor and Failure Analysis issues. 

Each guest lecturer is currently practicing Failure Analysis in industry and offers a unique view based upon their actual experience. The series addresses several major subject areas: Electron, Optical, SQUID & Atomic Force Microscopy,  MEMS Failure Analysis,  Integrated Circuit Debug and Validation, Advanced Fault Isolation Techniques and much more.

Each of the lectures is approximately 75 minutes long, total lecture time is approximately 37.5 hours. All lectures are available in their entirety on DVD. 

The lectures were presented at the UNM and the audience consisted of local UNM students, engineers from the area (Intel, Sandia Labs, Los Alamos Labs), and a nation wide audience from the National Technology University (NTU). 

You can purchase the entire Microelectronics Failure Analysis Lecture Series Set (30) lectures for $1,000 or they are offered in sets of 3 lectures per DVD, priced at $149 per DVD.

The Power Point notes used in the lectures are included with your purchase.

To learn more please select the Course Syllabus link on this page. The Syllabus includes the topics of all 30 lectures, click on any single DVD number for complete details of the  associated  lectures. 

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